IEEE Reliability Society History

September 19, 1949 - Professional Group on Quality Control of the IRE

November 4, 1954 - Name change approved to IRE Professional Group on Reliability and Quality Control

January 21, 1969 - Name change to IEEE Professional Group on Reliability

March 26, 1963 - Name change to IEEE Professional Technical Group on Reliability

August 26, 1964 - Name change to IEEE Reliability Group

January, 1979 - Name change to IEEE Reliability Society

Newsletter

• Vol 13 - Issue 1 - Jan 1968
• Vol 13 - Issue 2 - April 1968
• Vol 13 - Issue 3 - July 1968
• Vol 13 - Issue 4 - October 1968
• Vol 14 - Issue 1 - Jan 1969
• Vol 14 - Issue 2 - April 1969
• Vol 14 - Issue 4 - October 1969
• Vol 15 - Issue 1 - Jan 1970
• Vol 15 - Issue 2 - April 1970
• Vol 15 - Issue 3 - July 1970
• Vol 15 - Issue 4 - October 1970
• Vol 16 - Issue 1 - Jan 1971
• Vol 16 - Issue 4 - October 1971
• Vol 17 - Issue 1 - Jan 1972
• Vol 17 - Issue 3 - July 1972
• Vol 17 - Issue 4 - October 1972
• Vol 18 - Issue 1 - Jan 1973
• Vol 18 - Issue 2 - April 1973
• Vol 18 - Issue 3 - July 1973
• Vol 18 - Issue 4 - October 1973
• Vol 19 - Issue 1 - Jan 1974
• Vol 19 - Issue 2 - April 1974
• Vol 19 - Issue 3 - June 1974
• Vol 22 - Issue 1 - Jan 1977
• Vol 22 - Issue 2 - April 1977
• Vol 22 - Issue 3 - September 1977
• Vol 24 - Issue 3 - July 1978
• Vol 24 - Issue 4 - October 1978
• Vol 25 - Issue 1 - Jan 1979
• Vol 25 - Issue 2 - April 1979
• Vol 25 - Issue 3 - July 1979
• Vol 25 - Issue 4 - October 1979
• Vol 26 - Issue 1 - Jan 1980
• Vol 26 - Issue 2 - April 1980
• Vol 26 - Issue 3 - July 1980
• Vol 26 - Issue 4 - October 1980
• Vol 27 - Issue 1 - Jan 1981
• Vol 27 - Issue 2 - April 1981
• Vol 27 - Issue 3 - July 1981
• Vol 27 - Issue 4 - September 1981
• Vol 28 - Issue 1 - January 1982
• Vol 28 - Issue 2 - April 1982
• Vol 28 - Issue 3 - July 1982
• Vol 28 - Issue 4 - October 1982
• Vol 29 - Issue 1 - January 1983
• Vol 29 - Issue 4 - October 1983
• Vol 30 - Issue 1 - January 1984
• Vol 30 - Issue 2 - April 1984
• Vol 30 - Issue 3 - July 1984
• Vol 30 - Issue 4 - October 1984
• Vol 31 - Issue 1 - January 1985
• Vol 31 - Issue 2 - April 1985
• Vol 31 - Issue 3 - July 1985
• Vol 31 - Issue 4 - October 1985
• Vol 32 - Issue 1 - January 1986
• Vol 32 - Issue 2 - April 1986
• Vol 32 - Issue 3 - July 1986
• Vol 32 - Issue 4 - October 1986
• Vol 33 - Issue 1 - January 1987
• Vol 33 - Issue 2 - April 1987
• Vol 33 - Issue 3 - July 1987
• Vol 33 - Issue 4 - October 1987
• Vol 34 - Issue 1 - January 1988
• Vol 34 - Issue 2 - April 1988
• Vol 34 - Issue 3 - July 1988
• Vol 34 - Issue 4 - October 1988
• Vol 35 - Issue 1 - January 1989
• Vol 35 - Issue 2 - March 1989
• Vol 35 - Issue 3 - July 1989
• Vol 35 - Issue 4 - October 1989
• Vol 36 - Issue 1 - January 1990
• Vol 36 - Issue 2 - April 1990
• Vol 36 - Issue 3 - July 1990
• Vol 36 - Issue 4 - October 1990
• Vol 37 - Issue 1 - January 1991
• Vol 37 - Issue 2 - April 1991
• Vol 37 - Issue 3 - July 1991
• Vol 37 - Issue 4 - October 1991
• Vol 38 - Issue 1 - January 1992
• Vol 38 - Issue 2 - April 1992
• Vol 38 - Issue 4 - October 1992
• Vol 39 - Issue 1 - January 1993
• Vol 39 - Issue 2 - April 1993
• Vol 39 - Issue 3 - July 1993
• Vol 39 - Issue 4 - October 1993
• Vol 40 - Issue 1 - January 1994
• Vol 40 - Issue 2 - April 1994
• Vol 40 - Issue 3 - July 1994
• Vol 40 - Issue 4 - October 1994

Archival documents

• Fourth NY Conference on Electronic Reliability, 18 Oct 1963 program

External links

Link to IEEE Reliability Society