File:Fig4-EiglerSchweizerIBMatomsSTM1990.jpg: Difference between revisions
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Series of images taken in 1990 during Don Eigler and Erhard Schweizer's arrangement of xenon atoms on a Ni (110) surface, beginning with the dosing of the crystalline surface with Xe atoms. Each atom is 1.6 Angstroms high; each letter measures 50 A from top to bottom. Courtesy IBM Archives. | Series of images taken in 1990 during Don Eigler and Erhard Schweizer's arrangement of xenon atoms on a Ni (110) surface, beginning with the dosing of the crystalline surface with Xe atoms. Each atom is 1.6 Angstroms high; each letter measures 50 A from top to bottom. Courtesy IBM Archives. | ||
[[Category:Scientific_tools_and_discoveries|{{PAGENAME}}]] | [[Category:Scientific_tools_and_discoveries|{{PAGENAME}}]] | ||
Revision as of 20:44, 13 February 2014
Series of images taken in 1990 during Don Eigler and Erhard Schweizer's arrangement of xenon atoms on a Ni (110) surface, beginning with the dosing of the crystalline surface with Xe atoms. Each atom is 1.6 Angstroms high; each letter measures 50 A from top to bottom. Courtesy IBM Archives.
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| current | 20:04, 13 February 2014 |  | 728 × 1,126 (355 KB) | Administrator7 (talk | contribs) | Series of images taken during Don Eigler and Erhard Schweizer's arrangement of xenon atoms on a Ni (110) surface, beginning with the dosing of the crystalline surface with Xe atoms. Each atom is 1.6 Angstroms high; each letter measures 50 A from top to bo |
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